The 2017 Accelerated Stress Testing and Reliability (ASTR) Conference is
focused on highlighting cutting-edge methods to deliver maximum
cost-benefits from accelerated reliability testing. ASTR 2017 is
relevant to product development, test and manufacturers involved in the
aerospace, automotive, consumer electronics, defense, biomedical,
telecommunications, software and other leading industries where
reliability is a key driver of operational and business success. ASTR
2017 will present detailed case studies, best practices, lessons
learned, and clear insight on how to best apply and integrate
accelerated testing tools and methods.
Students welcome to present research.
Abstracts are invited now with a 150 words summary due by March 15!
The 2017 focus will include (but not limited to):
The science of test acceleration: integration of design modeling, analysis and accelerated testing
New Accelerated Test Standards in progress
Effects of corrosion and high energy radiation on reliability
Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS)
Complete submission details are available at http://ieee-astr.org/ASTR_Technical_program.php.
OR send proposed papers to JMREL2@Aol.com James McLinn
Become part of this active, growing conference sponsored by both the
ASQ-Reliability Division and the IEEE- Reliability Society. The hotel
has special rates for this conference.
There are many reasons to attend this conference! Make this your fall destination:
Visit a local Technology company
Learn new Hardware and Software techniques
Understand Accelerated Test • Network with similar professionals
Develop Better Life Test plans
Robustness Testing
