Scope & Topics
Third International Conference on Electrical Engineering (ELEG 2017) aims to bring together researchers and practitioners from academia and industry to focus on recent systems and techniques in the broad field of Electrical Engineering. Original research papers, state-of-the-art reviews are invited for publication in all areas of Electrical Engineering.
Topics of Interest :
Authors are solicited to contribute to the conference by submitting articles that illustrate research results, projects, surveying works and industrial experiences that describe significant advances in the following areas, but are not limited to
Communication
Control and Robotics
Electromagnetics and Photonics
High Voltage Engineering
Image Processing and Multimedia, Biomedical Imaging
Measurements and Instrumentation
Nano Devices and Integrated Systems
Power Electronics
Power Systems
Systems Science and Signal Processing
Paper Submission
Authors are invited to submit papers through the Conference Submission System by July 08, 2017. Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this conference. The proceedings of the conference will be published by Computer Science Conference Proceedings in Computer Science & Information Technology (CS & IT) series (Confirmed).
Extended version of the selected papers from ELEG 2017 will be published as special issue in the following journals.
Circuits and Systems: An International Journal (CSIJ)
Electrical Engineering: An International Journal (EEIJ)
Important Dates
Submission Deadline : July 08, 2017
Authors Notification : August 08, 2017
Final Manuscript Due : August 10, 2017
Co - Located Event
Third International Conference on Applied Control, Electrical and Electronics Engineering (CEEE 2017)
Program Committe Members
Fendy Santoso, University of New South Wales, Australia
Farhad Shahnia, Curtin University, Australia
Cetin Akinci, Istanbul Technical University, Turkey
Emilio Jimenez, University of La Rioja, Spain
Nageh Allam, Massachusetts Institute of Technology, USA
Ruomeng Yu, Georgia Institute of Technology, USA
R. Joseph Daniel, Annamalai University, India
Wensong Jiang, Beihang University, China
Raveendra Rao, University of Western Ontario, Canada
